About Image SXM
Image SXM is a version of the public domain image analysis software NIH Image that has been extended to handle the loading, display and analysis of scanning microscope images. Image SXM supports SAM, SCM, SEM, SFM, SLM, SNOM, SPM and STM images from the following systems: Asylum Research, Burleigh Instruments, Digital Instruments NanoScope II, Digital Instruments NanoScope III/IV, DME Rasterscope, DME Surface Data File, Gatan DigitalMicrograph, JEOL JSM, JEOL WinSem, JEOL WinSPM, JPK Instruments, Klocke Nanotechnik Atomikro, Leica TCS, LEO SEM, Molecular Imaging PicoScan, NanoMagnetics Instruments SPMSIF, Nanonics Imaging, Nanonis, Nanotec Electronica WSxM, Noran Instruments Vantage, NT-MDT, Omicron Vakuumphysik, Omicron SCALA, Oxford Instruments TOPSystem, Park Scientific Instruments HFS-LIF, Park Scientific Instruments HDF, Philips SEM, Quesant Instruments, RHK Technology SPM-3 RHK Technology XPM Pro, Seiko Instruments (SIINT) SPI, SPECS STM Aarhus, ThermoMicroscopes, TopoMetrix SPMLab, Unisoku, Vacuum Generators SAM, WA Technology, Zeiss LSM.
Changes in this version:Updated support for Nanonis SPM images.New algorithm in 'Parasite Counting Analysis'.New algorithm in 'Lymphocyte Flow Analysis'.Convolutions now process to the edges.Video grabbing now works for images > 800x600.Scaling images of width > 8000 pixels could give artefacts.Image compensation for JEOL SPM images was not applied correctly.Calculation of a perimeter could give an underestimate by 0.5 pixels.
( By Steve Barrett - Image SXM Publisher )